Author/Authors :
Finkbeiner، نويسنده , , F and Nussbaumer، نويسنده , , Th and Lerch، نويسنده , , Ph and Zehnder، نويسنده , , A and Ott، نويسنده , , H.R، نويسنده ,
Abstract :
Results from a comparison between current-voltage data measured on Nb/Al/AlOx/Al/Nb tunneling junctions to a proximity effect model proposed by Golubov et al. [J. Low Temp. Phys. 70 (1988) 83] are used to get an estimation of the quasiparticle collection as a function of the Al-film thickness (4 and 120 nm) in X-ray detectors.
