X-ray spectroscopy using MOS CCDs

MOS charge coupled devices (CCDs) have been under development for use as X-ray detectors for Astronomy for over 12 years. In this time many improvements have been implemented in the devices leading to the broad band X-ray detection between 0.1–20 keV, with high detection efficiency and spectral resolution. This paper compares the X-ray performance of different approaches towards CCD manufacture. In addition, for low signal strength applications, the background rejection of the detector is important for improved sensitivity and a comparison is made of the ability to reject charged particle signals.