Title of article :
Characterization of an ONO-stacked insulator film for a silicon micro-strip detector
Author/Authors :
Okuno، نويسنده , , Shoji and Ikeda، نويسنده , , Hirokazu and Saitoh، نويسنده , , Yutaka and Akamine، نويسنده , , Tadao and Inoue، نويسنده , , Masahiro and Yamanaka، نويسنده , , Junko and Kadoi، نويسنده , , Kiyoaki and Kojima، نويسنده , , Yoshikazu and Miyahara، نويسنده , , Shin-ichi and Kamiya، نويسنده , , Masaaki، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1997
Pages :
7
From page :
299
To page :
305
Abstract :
A semi-empirical model for an ONO-stacked insulator film is presented together with its implications. The model covers ONO, ON, and NO films as well as single-layered SiO2 and Si3N4. We eventually present an assessment for estimating the lifetime of an ONO-stacked insulator film for a given configuration.
Journal title :
Nuclear Instruments and Methods in Physics Research Section A
Serial Year :
1997
Journal title :
Nuclear Instruments and Methods in Physics Research Section A
Record number :
2174756
Link To Document :
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