Title of article :
Design and evaluation of AC-coupled, FOXFET-biased, “edge-on” silicon strip detectors for X-ray imaging
Author/Authors :
Arfelli، نويسنده , , F. and Bonvicini، نويسنده , , V. and Bravin، نويسنده , , A. and Burger، نويسنده , , P. and Cantatore، نويسنده , , G. and Castelli، نويسنده , , E. and Di Michiel، نويسنده , , M. and Longo، نويسنده , , R. and Olivo، نويسنده , , A. K. Pani، نويسنده , , S. and Pontoni، نويسنده , , D. and Poropat، نويسنده , , P. and Prest، نويسنده , , M. and Rashevsky، نويسنده , , A. and Tromba، نويسنده , , G. and Vacchi، نويسنده , , A. and Za، نويسنده ,
Abstract :
A silicon strip detector for the SYRMEP (SYnchrotron Radiation for MEdical Physics) experiment has been designed and realised. The main features of this detector are AC-coupling through integrated coupling capacitors, DC bias of the strips by means of a gated punch-through structure, bulk contact on the junction side through a forward-biased p+ implant, thinned entrance window for the incoming radiation (in an “edge-on” geometry) and integrated fan-in on active silicon. Results of laboratory tests of the detector parameters, allowing a thorough evaluation of the technological solutions employed, are presented.
