Author/Authors :
Fujiwara، نويسنده , , M.C and Beer، نويسنده , , G.A and Beveridge، نويسنده , , J.L and Douglas، نويسنده , , J.L and Huber، نويسنده , , T.M and Jacot-Guillarmod، نويسنده , , R and Kim، نويسنده , , S.K and Knowles، نويسنده , , P.E and Kunselman، نويسنده , , A.R and Maier، نويسنده , , M and Marshall، نويسنده , , G.M and Mason، نويسنده , , G.R and Mulhauser، نويسنده , , F and Olin، نويسنده , , A and Petitjean، نويسنده , , C and Porcelli، نويسنده , , T.A and Zmeskal، نويسنده , , J، نويسنده ,
Abstract :
A method is reported for measuring the thickness and uniformity of thin films of solidified gas targets. The energy of α particles traversing the film is measured and the energy loss is converted to thickness using the range. The uniformity is determined by measuring the thickness at different positions with an array of sources. Monte Carlo simulations have been performed to study the film deposition mechanism. Thickness calibrations for a TRIUMF solid hydrogen target system are presented.
