Author/Authors :
Jiang، نويسنده , , Dayong and Tian، نويسنده , , Chunguang and Liu، نويسنده , , Qingfei and Zhao، نويسنده , , Man and Qin، نويسنده , , Jieming and Hou، نويسنده , , Jianhua and Gao، نويسنده , , Shang and Liang، نويسنده , , Qingcheng and Zhao، نويسنده , , Jianxun، نويسنده ,
Abstract :
We used a contact-mode atomic force microscopy (AFM) to study the mechanical properties of an individual ZnO nanowire in the open air. It is noteworthy that the Young׳s modulus can be determined by an AFM tip compressing a single nanowire on a rigid substrate, which can bring more repeatability and accuracy for the measurements. In particular, the calculated radial Young׳s modulus of ZnO nanowires is consistent with the data of ZnO bulks and thin films. We also present the Young׳s modulus with different diameters, and all these are discussed deeply.
Keywords :
ZNO , nanowires , Young?s modulus , AFM