Title of article :
X-ray diffraction of samples irradiated by intensive atomic flows of low energy
Author/Authors :
Volosov، نويسنده , , V.I. and Tolochko، نويسنده , , B.P. and Churkin، نويسنده , , I.N.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1998
Abstract :
Experiments on the irradiation of titanium and niobium targets by flows of carbon atoms of low energy (〈W〉 ∼ 2.5 keV, j ∼ 50 mA/cm2) were made with a source of fast heavy atoms. Diagnostics of the irradiated samples was conducted by X-ray diffraction on the “anomalous scattering” station SR (the Budker INP). The measured thicknesses of the carbide layers (3.5 μm for TiC, 0.8 μm for Nb2C) show the possibility of a high effective implantation by low energy atomic flows.
Keywords :
X-ray diffraction , Low energy implantation , Intensive atomic flows
Journal title :
Nuclear Instruments and Methods in Physics Research Section A
Journal title :
Nuclear Instruments and Methods in Physics Research Section A