A cone penetrometer X-ray fluorescence tool for the analysis of subsurface heavy metal contamination

Past use of X-ray fluorescence for the analysis of heavy metal contamination in soil was limited to analyzing either collected samples or soil on an exposed surface. To investigate subsurface contamination at even shallow depths, extensive and often expensive drilling or excavation was required to obtain either a sample or an exposed surface. A cone penetrometer X-ray fluorescence tool has been developed by the US Army, Navy and Air Force Site Characterization and Analysis Penetrometer System (SCAPS) to analyze subsurface metal contamination in situ. Using this tool, subsurface metal contamination can be investigated in real time without sampling or excavation. A schematic diagram of the penetrometer tool is provided and operating capabilities are discussed. The results of bench testing and a calibration for lead contaminated standards are presented.