Title of article :
Beam electron microprobe
Author/Authors :
Stoller، نويسنده , , D. and Dueck، نويسنده , , T. and Muterspaugh، نويسنده , , Steve M. and Pollock، نويسنده , , R.E.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1999
Abstract :
A beam profile monitor based on the deflection of a probe electron beam by the electric field of a stored, electron-cooled proton beam is described and first results are presented. Electrons were transported parallel to the proton beam by a uniform longitudinal magnetic field. The probe beam may be slowly scanned across the stored beam to determine its intensity, position, and size. Alternatively, it may be scanned rapidly over a narrow range within the interior of the stored beam for continuous observation of the changing central density during cooling. Examples of a two dimensional charge density profile obtained from a raster scan and of a cooling alignment study illustrate the scope of measurements made possible by this device.
Journal title :
Nuclear Instruments and Methods in Physics Research Section A
Journal title :
Nuclear Instruments and Methods in Physics Research Section A