Title of article :
Effect of sample thickness on the measured mass attenuation coefficients of some compounds and elements for 59.54, 661.6 and 1332.5 keV γ-rays
Author/Authors :
Abdel-Rahman، نويسنده , , M.A and Badawi، نويسنده , , E.A and Abdel-Hady، نويسنده , , Y.L and Kamel، نويسنده , , N، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2000
Abstract :
Measurements have been made to determine γ-rays attenuation coefficients very accurately by using an extremely narrow-collimated-beam transmission method. The effect of the sample thickness on the measured values of the mass attenuation coefficients (μ/ρ) cm2/g of perspex, bakelite, paraffin, Al, Cu, Pb and Hg have been investigated at three different γ-ray energies (59.54, 661.6 and 1332.5 keV). It is seen that for these chosen materials (μ/ρ) remains constant in good agreement with the theoretical values up to 3 mean free paths and after that (μ/ρ) values for Cu, Pb and Hg decrease with further increase in the absorber thickness. This result may be attributed to the increase in the number of coherent small-angle scattering photons which reach the detector.
Keywords :
Attenuation coefficients , ?-rays
Journal title :
Nuclear Instruments and Methods in Physics Research Section A
Journal title :
Nuclear Instruments and Methods in Physics Research Section A