Title of article :
Bayesian analysis for masked system failure data using non-identical Weibull models
Author/Authors :
Sanjib Basu، نويسنده , , Asit P. Basu، نويسنده , , Chiranjit Mukhopadhyay، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1999
Pages :
21
From page :
255
To page :
275
Keywords :
Adaptive rejection , Competing risks , Gibbs sampling , Log-concave densities , Masking , Weibull distribution
Journal title :
Journal of Statistical Planning and Inference
Serial Year :
1999
Journal title :
Journal of Statistical Planning and Inference
Record number :
218744
Link To Document :
https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=218744
بازگشت