Title of article
Scanning soft X-ray spectromicroscopy at the Pohang Light Source: commissioning results
Author/Authors
Shin، نويسنده , , H.-J. and Lee، نويسنده , , M.K.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2001
Pages
4
From page
909
To page
912
Abstract
A scanning spectromicroscopy facility has been installed at the undulator radiation beamline at the Pohang Light Source. The spectromicroscopy is operational in both the scanning transmission X-ray microscopy (STXM) and the scanning photoelectron microscopy (SPEM) modes. Currently, the measured X-ray spot size on the sample is about 0.4 μm. The effective photon energy range of the STXM is 250–1000 eV and that of the SPEM is 400–1000 eV. The performance of the facility is presented in this report.
Keywords
SPEM , Spectromicroscopy , STXM , X-ray microscopy
Journal title
Nuclear Instruments and Methods in Physics Research Section A
Serial Year
2001
Journal title
Nuclear Instruments and Methods in Physics Research Section A
Record number
2192167
Link To Document