Author/Authors :
Suzuki، نويسنده , , Y. and Awaji، نويسنده , , M. and Kohmura، نويسنده , , Y. R. Takeuchi ، نويسنده , , A. and Takano، نويسنده , , H. and Kamijo، نويسنده , , N. and Tamura، نويسنده , , S. and Yasumoto، نويسنده , , M. and Handa، نويسنده , , K.، نويسنده ,
Abstract :
A hard X-ray microbeam created from a sputtered-sliced Fresnel zone plate has been tested at SPring-8 undulator beamline. Focusing properties are evaluated in the X-ray wavelength regions of 0.15–1.5 Å. The measured focal beam size is about 0.6 μm at an X-ray wavelength of 1.4 Å. In a scanning microscopy experiment, resolution-test-patterns with 0.2 μm structure are resolved at an X-ray wavelength of 0.45 Å.
Keywords :
Hard X-ray microbeam , Scanning microscopy , Fresnel zone plate , Synchrotron radiation
