Dislocation density analysis in single grains of steel by X-ray scanning microdiffraction

A new set-up for X-ray micro-diffraction has been developed on the ESRF beamline ID22. It allows microscopic characterization of materials with micrometer resolution. This facilitates the measurement of material quantities as average size of the coherently diffracting volume, local dislocation density, residual stress, local fluctuation of the residual stress, and intragranular misorientation from single grains of a polycrystalline material. The first application on an IF-Ti steel after different thermo-mechanical treatments is presented.