Title of article :
Measurement of synchrotron pulse durations using surface photovoltage transients
Author/Authors :
Glover، نويسنده , , T.E. and Ackermann، نويسنده , , G.D. and Belkacem، نويسنده , , A. and Feinberg، نويسنده , , B. and Heimann، نويسنده , , P.A. and Hussain، نويسنده , , Z. and Padmore، نويسنده , , H.A. and Ray، نويسنده , , C. and Schoenlein، نويسنده , , R.W. and Steele، نويسنده , , W.F.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2001
Pages :
3
From page :
1438
To page :
1440
Abstract :
We report results on experiments using combined laser and synchrotron radiation. Picosecond laser pulses at 800 nm are used to induce surface photovoltage transients in p-type Si samples. A two-component decay is observed. The fast component of decay provides a direct measure of synchrotron soft X-ray pulse durations.
Keywords :
X-ray pulse measurement , Combined laser-synchrotron spectroscopy
Journal title :
Nuclear Instruments and Methods in Physics Research Section A
Serial Year :
2001
Journal title :
Nuclear Instruments and Methods in Physics Research Section A
Record number :
2192293
Link To Document :
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