Title of article :
Jefferson Lab IR demo FEL photocathode quantum efficiency scanner
Author/Authors :
Gubeli، نويسنده , , J and Evans، نويسنده , , R and Grippo، نويسنده , , A and Jordan، نويسنده , , K and Shinn، نويسنده , , M and Siggins، نويسنده , , T، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2001
Pages :
5
From page :
554
To page :
558
Abstract :
Jefferson Laboratoryʹs Free Electron Laser (FEL) incorporates a cesiated gallium arsenide (GaAs) DC photocathode gun as its electron source. By using a set of scanning mirrors, the surface of the GaAs wafer is illuminated with a 543.5nm helium–neon laser. Measuring the current flow across the biased photocathode generates a quantum efficiency (QE) map of the 1-in. diameter wafer surface. The resulting QE map provides a very detailed picture of the efficiency of the wafer surface. By generating a QE map in a matter of minutes, the photocathode scanner has proven to be an exceptional tool in quickly determining sensitivity and availability of the photocathode for operation.
Keywords :
GaAs photocathode , Raster/scanner , Quantum efficiency
Journal title :
Nuclear Instruments and Methods in Physics Research Section A
Serial Year :
2001
Journal title :
Nuclear Instruments and Methods in Physics Research Section A
Record number :
2193382
Link To Document :
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