Title of article :
Functional characterization of planar sensors with active edges using laser and X-ray beam scans
Author/Authors :
Povoli، نويسنده , , M. and Bagolini، نويسنده , , A. and Boscardin، نويسنده , , M. and Dalla Betta، نويسنده , , G.-F. and Giacomini، نويسنده , , G. and Hasi، نويسنده , , J. and Oh، نويسنده , , A. and Zorzi، نويسنده , , N.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2013
Abstract :
We report on the functional characterization of planar sensors with active edges fabricated at Fondazione Bruno Kessler (FBK), Trento, Italy. The measurements here reported were performed by means of laser and X-ray beam scans mainly focusing on the signal efficiency of the edge region of the devices. Results are very encouraging and show very good sensitivity up to few microns away from the device physical edge.
Keywords :
Active edge , Silicon detectors , Numerical simulations , TCAD , Test structures , functional characterization , X-Ray , Laser
Journal title :
Nuclear Instruments and Methods in Physics Research Section A
Journal title :
Nuclear Instruments and Methods in Physics Research Section A
