Author/Authors :
Den Hartog، نويسنده , , P. and Moog، نويسنده , , E. and Benson، نويسنده , , C. and Erdmann، نويسنده , , M. and Lumpkin، نويسنده , , A. and Makarov، نويسنده , , O. and Petra، نويسنده , , Janine M. and Tieman، نويسنده , , B. and Trakhtenberg، نويسنده , , E. and Wiemerslage، نويسنده , , G.، نويسنده ,
Abstract :
The Advanced Photon Source self-amplified spontaneous emission (SASE) free-electron laser (FEL) uses diagnostics between undulator sections to characterize the light and the electron beam. These diagnostics enable z-dependent measurements of the exponential growth of the radiation and of the microbunching. The original diagnostics were designed for visible light. To enable measurements down to 265 nm, UV-enhanced cameras and fused-silica lenses have been installed. We have now designed a diagnostics suite that will enable us to continue measurements down to 50 nm using reflective optics and back-illuminated CCD cameras operating in vacuum. We describe the enhancements to the diagnostics for operation in the UV and VUV.
Keywords :
VUV , SASE , free-electron , APS , FEL , Laser
