Title of article :
X-ray imaging with “edge-on” microchannel plate detector: first experimental results
Author/Authors :
Victor V. and Shikhaliev، نويسنده , , Polad M. and Molloi، نويسنده , , Sabee Molloi، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2003
Abstract :
A novel scanning slit X-ray imaging system based on an “edge-on” microchannel plate detector was developed and tested. Images were acquired at 50 kV(p) X-ray tube voltage with a limiting spatial resolution of 7 lp/mm. The pixel noise was measured to be 0.3 count/pixel/s for a 50×70 μm2 pixel size. This photon counting detector can be considered to be virtually noise free.
Keywords :
Scanning slit , x-ray imaging , MCP detector , “Edge-on” method
Journal title :
Nuclear Instruments and Methods in Physics Research Section A
Journal title :
Nuclear Instruments and Methods in Physics Research Section A
