Title of article :
Influence of the film deposition rate and humidity on the properties of thin CsI photocathodes
Author/Authors :
Nitti، نويسنده , , M.A. and Senesi، نويسنده , , G.S. and Liotino، نويسنده , , A. and Nappi، نويسنده , , E. and Valentini، نويسنده , , A. and Singh، نويسنده , , B.K.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2004
Pages :
11
From page :
323
To page :
333
Abstract :
Optical and photoemissive properties of CsI photocathodes (PCs) grown at two different evaporation rates (1 and 0.04 nm/s) have been investigated. rface morphology of 300-nm-thick CsI films was also studied by means of atomic force microscopy. After 24-h exposure to humid air, properties of PCs grown at the slowest evaporation rate resulted affected more than those obtained at the fastest rate, making this latter more adequate for the photocathode preparation.
Keywords :
CsI photocathodes , Humid-air exposure , Optical properties , Crystalline structure , surface morphology , Defect diffusion , atomic force microscopy , Evaporation rate
Journal title :
Nuclear Instruments and Methods in Physics Research Section A
Serial Year :
2004
Journal title :
Nuclear Instruments and Methods in Physics Research Section A
Record number :
2198223
Link To Document :
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