Title of article
Hard X-ray polarization measured with a Compton polarimeter at synchrotron radiation facility
Author/Authors
Tokanai، نويسنده , , F. and Sakurai، نويسنده , , H. and Gunji، نويسنده , , S. and Motegi، نويسنده , , S. and Toyokawa، نويسنده , , H. and Suzuki، نويسنده , , M. and Hirota، نويسنده , , K. N. Kishimoto، نويسنده , , S. and Hayashida، نويسنده , , K.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2004
Pages
7
From page
446
To page
452
Abstract
A hard X-ray polarimeter with CdTe detectors has been developed for measurement of the degree of X-ray polarization at synchrotron radiation facilities. It utilizes 90° Compton scattering from the low Z targets. Measurements were performed at both facilities of the beamline BL38B1 in SPring-8 and the beamline BL14A in KEK-PF. The degrees of X-ray polarization for 20 keV X-rays are 99% and 82% at the BL38B1 in SPring-8 and BL14A in KEK-PF, respectively. The polarization degrees in the energy range of 15 and 40 keV correspond to 99.6±0.2% and 96.1±0.2% at the beamline BL38B1 in SPring-8. The analyzing power of the polarimeter was estimated by the Monte Carlo simulation with EGS4. The synchrotron radiation facilities provide highly polarized X-ray beams at energies above 15 keV.
Keywords
X-ray Astronomy , Synchrotron radiation facility , Polarimeter , CdTe detector , Compton scattering
Journal title
Nuclear Instruments and Methods in Physics Research Section A
Serial Year
2004
Journal title
Nuclear Instruments and Methods in Physics Research Section A
Record number
2198368
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