Title of article :
Microscopic parameters of materials containing GaN/AlN and InAs/AlAs heterostructures
Author/Authors :
Erenburg، نويسنده , , S.B and Bausk، نويسنده , , N.V and Mazalov، نويسنده , , L.N. and Toropov، نويسنده , , A.I. and Zhuravlev، نويسنده , , K.S. and Mansurov، نويسنده , , V.G. and Shamirsaev، نويسنده , , T.S. and Bras، نويسنده , , W. and Nikitenko، نويسنده , , S.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2005
Pages :
6
From page :
188
To page :
193
Abstract :
EXAFS spectra of AIIIBv heterostructures have been measured at the European Synchrotron Radiation Facility (ESRF, Grenoble, France), DUBBLE beam-line. It has been found that the first shell RGa−N interatomic distance in heterostructure GaN/AlN is equal to 1.91 Å, which is 0.04 Å smaller compared to crystalline GaN. For the second Ga–Ga shell an interatomic distance RGa−Ga of 3.13 Å was found, which is 0.06 Å smaller than in crystalline GaN. The coordination number NGa−Ga was found to be 6.0. Our results suggest that this heterostructure with discrete electronic spectra contains two-dimentional islands with strong elastic strains. The first shell interatomic distance RIn−As for the heterostructure containing InAs quantum dots (QDs) is 0.04 Å lower in comparison with those for the bulk InAs and is 2.58 Å. The second shell interatomic distance RIn−In is 3.99 Å, i.e. 0.29 Å smaller compared to the bulk InAs. The Debye–Waller factor was found to be 0.022 Å2, the coordination number NIn−In∼2.0. The results obtained suggest that InAs/AlAs heterostructure with discrete electronic spectra contains three-dimentional islands with unhomogeneity of microstructure due to elastic strain relaxation.
Keywords :
EXAFS , XANES , Quantum dots , Molecular Beam Epitaxy
Journal title :
Nuclear Instruments and Methods in Physics Research Section A
Serial Year :
2005
Journal title :
Nuclear Instruments and Methods in Physics Research Section A
Record number :
2198878
Link To Document :
بازگشت