Title of article
Hard X-ray resonant electronic spectroscopy in transition metal oxides
Author/Authors
Le Fèvre، نويسنده , , P. and Magnan، نويسنده , , H. and Chandesris، نويسنده , , D. and Jupille، نويسنده , , J. and Bourgeois، نويسنده , , S. and Barbier، نويسنده , , A. and Drube، نويسنده , , W. and Uozumi، نويسنده , , T. and Kotani، نويسنده , , A.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2005
Pages
11
From page
176
To page
186
Abstract
K-edge X-ray absorption and 2p-XPS spectra of 3d-element oxides present spectral features which cannot be explained within a simple one-electron model. These features reveal the fine electronic structure of transition metal (TM) oxides valence states resulting from hybridized TM-3d and O-2p states, and the correlations between these valence electrons. In this paper, we show how resonant electronic spectroscopy (resonant Auger or resonant photoelectron spectroscopy) around the TM K-edge can be used to interpret the structures of the threshold and, with the help of theoretical calculation, to determine the electronic configuration of the excited ion. Quadrupolar transitions towards localized 3d orbitals are hence detected and quantitatively characterized in the titanium K-edge prepeaks in TiO2 and in the Ni K-edge prepeaks in NiO by angular-dependent resonant KLL Auger measurements. Valuable information also seems to be available in the resonant behavior of 2p-XPS spectra of NiO and Fe2O3.
Keywords
oxides , Auger spectroscopy , Photoemission , XAS
Journal title
Nuclear Instruments and Methods in Physics Research Section A
Serial Year
2005
Journal title
Nuclear Instruments and Methods in Physics Research Section A
Record number
2199121
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