Characterization and quality control of CMS silicon microstrip sensors

This paper presents the results of quality control tests performed on single-sided, pre-production silicon microstrip detectors for the compact muon solenoid silicon strip tracker. These tests included both a global and a strip-by-strip electrical characterization of the sensors. Additionally, all sensors were optically inspected as part of the quality control process. The goal of the tests was to finalize the procedures of the CMS Quality Test Centres, to qualify the sensor production lines, and to compare measurement data provided by the manufacturers with our own.