Silicon strip detector applied to X-ray diffractometer: Angular resolution and counting rate

The silicon strip detector (128 strips with 100 μm strip pitch) was mounted at the arm of laboratory X-ray diffractometer with 230 mm instrument radius. With the use of a LaB6 standard sample we demonstrate the angular resolution of 0.05° at low angles for classical Bragg–Brentano configuration. Experiments with a large LiF single crystal makes it possible to experimentally determine the detector limit range of linearity (30 000 cps/strip) and maximum counting range (100 000 cps/strip).