Title of article
The effect of protons on E2V Technologies L3Vision CCDs
Author/Authors
Smith، نويسنده , , D.R. and Holland، نويسنده , , A.D. and Robbins، نويسنده , , M.S.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2003
Pages
4
From page
296
To page
299
Abstract
The effect of different 10 MeV equivalent proton fluences on the performance of E2V Technologies (formerly Marconi applied technologies, formerly EEV) L3Vision Charge Coupled Devices (CCDs) was investigated. The first experimental radiation damage results of the L3Vision device are presented, with emphasis given to the analysis of damage to the gain register of the device. Changes in dark current and generation of bright pixels in the CCD image, store, readout register and gain register as a result of proton irradiation are reported and viewed in light of the potential use of the device in space-based applications.
Keywords
L3Vision , Charge coupled device , proton , Damage , Low light level , radiation
Journal title
Nuclear Instruments and Methods in Physics Research Section A
Serial Year
2003
Journal title
Nuclear Instruments and Methods in Physics Research Section A
Record number
2200575
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