Author/Authors :
Brunken، نويسنده , , M. and Gopych، نويسنده , , M. and Grنf، نويسنده , , H.-D. and Laier، نويسنده , , U. and Müller، نويسنده , , W. and Platz، نويسنده , , M. and Richter، نويسنده , , A. and Watzlawik، نويسنده , , Gary S. and Weiland، نويسنده , , T.، نويسنده ,
Abstract :
The quality factors of the 20 cell, 3 GHz niobium cavities of the S-DALINAC are smaller by almost a factor of three compared to their design value. Combined with the limited cryogenic power of the helium refrigerator in use, this restricts the maximum electron energy of the S-DALINAC in continuous wave operation. Extensive studies to elaborate the origin of this degradation are presented. A 120 ∘ C baking combined with appropriate diagnostic tools for an attempt to improve the Q values has been applied to nine of the 11 cavities. The impact of this treatment on the BCS and residual resistance was evaluated and both were improved. Additionally, quality factor measurements of all modes of the TM 010 passband allowed to derive a spatial distribution of the mean surface resistance. The RF losses in the end cells are systematically higher compared to the inner cells. The studies presented in this article allowed to develop a model describing the Q degradation of the resonators and thereby identifying possible prospects to cure this limitation.
