Author/Authors :
Bolla، نويسنده , , G. and Atac، نويسنده , , M. and Pavlicek، نويسنده , , V. and Nahn، نويسنده , , S. and Garcia-Sciveres، نويسنده , , M. and Mumford، نويسنده , , R. and Nguyen، نويسنده , , T. and Forrester، نويسنده , , S. and Hill، نويسنده , , C. and Olszewski، نويسنده , , J. and Rahaman، نويسنده , , A. and Goldstein، نويسنده , , J. and Ashmanskas، نويسنده , , B. and Maruyama، نويسنده , , T. and Zimmerman، نويسنده , , T. and Moccia، نويسنده ,
Abstract :
Unrecoverable internal failures of modules in the CDF Run2 Silicon detector have been observed since its installation in early 2001. A fraction of these failures has been categorized as infant mortality. Other failures occurring later were strongly correlated with fixed trigger conditions. These failures are explained by wire-bonds breaking due to fatigue stress induced by resonant vibration. These resonant vibrations are a direct consequence of the oscillating Lorentz forces induced by the 1.4 T magnetic field on wire-bonds carrying non-DC current. Changes have been implemented in data-taking procedures in order to minimize the occurrences of such failures and to prolong the lifetime of the detector itself. A more general analysis of the topic has been pursued. Changes in the packaging and assembly processes for future applications have been investigated.
