Ion optics of a new time-of-flight mass spectrometer for quantitative surface analysis

A new time-of-flight instrument for quantitative surface analysis was developed and constructed at Argonne National Laboratory. It implements ion sputtering and laser desorption for probing analyzed samples and can operate in regimes of secondary neutral mass spectrometry with laser post-ionization and secondary ion mass spectrometry. The instrument incorporates two new ion optics developments: (1) “push–pull” front end ion optics and (2) focusing and deflecting lens. Implementing these novel elements significantly enhance analytical capabilities of the instrument. Extensive three-dimensional computer simulations of the instrument were conducted in SIMION 3D© to perfect its ion optics. The operating principles of the new ion optical systems are described, and a scheme of the new instrument is outlined together with its operating modes.