Some studies on the pulse-height loss due to capacitive decay in the detector-circuit of parallel plate ionization chambers

Pulse-type ionization chambers are invariably operated in the electron-sensitive mode where the capacitive decay in the detector-circuit during the electron collection produces loss in the pulse-height. In order to understand and appreciate the effect of this capacitive decay on the detector response, we have carried out Monte Carlo simulations of the response of two-electrode parallel plate ionization chambers with and without the capacitive decay keeping shaping time so large that the ballistic deficit is negligibly small. These simulations have been carried out incorporating the physical processes, namely, emission of charged particles from a point radioactive source, the generation of charge carriers in the active volume, separation and acceleration of the charge carriers, transport of the charge carriers, induction of charges on the electrodes, pulse processing by preamplifier-amplifier network, etc. These simulations have shown that the concerned capacitive decay produces appreciable loss in the pulse-height, if the detector-circuit time constant is of the order of maximum electron collection time. We have also carried out measurements on the pulse-height loss due to the capacitive decay in the detector-circuit during the electron collection for a two-electrode parallel plate ionization chamber. The experimental data on the pulse-height loss match reasonably well with the theoretical predictions.