Title of article
Progress in fabrication of high quality tantalum film absorber for STJ radiation detector
Author/Authors
E and Lissitski، نويسنده , , M.P. and Perez de Lara، نويسنده , , D. and Cristiano، نويسنده , , R. and Della Rocca، نويسنده , , M.L. and Maritato، نويسنده , , L. and SALVATO، نويسنده , , M.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2004
Pages
3
From page
243
To page
245
Abstract
We report the fabrication and characterization of high quality tantalum films as absorbers for STJ radiation detectors. Values of the residual resistance ratio up to 75 and bulk value of the superconducting transition temperature Tc=4.5±0.1 K have been achieved. Devices for detection with lateral aluminum superconducting tunnel junctions have been fabricated on such films. The detector response to X-ray is discussed.
Keywords
Superconducting tunnel junction detector , Epitaxial thin film growing , Residual resistance ratio
Journal title
Nuclear Instruments and Methods in Physics Research Section A
Serial Year
2004
Journal title
Nuclear Instruments and Methods in Physics Research Section A
Record number
2201779
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