Title of article :
Visualization of heavy ion-induced charge production in a CMOS image sensor
Author/Authors :
Végh، نويسنده , , J and Kerek، نويسنده , , A and Klamra، نويسنده , , W and Molnلr، نويسنده , , J and Norlin، نويسنده , , L.-O and Novلk، نويسنده , , D and Sanchez-Crespo، نويسنده , , A and Van der Marel، نويسنده , , J and Fenyvesi، نويسنده , , A and Valastyلn، نويسنده , , I and Sipos، نويسنده , , A، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2004
Pages :
7
From page :
229
To page :
235
Abstract :
A commercial CMOS image sensor was irradiated with heavy ion beams in the several MeV energy range. The image sensor is equipped with a standard video output. The data were collected on-line through frame grabbing and analysed off-line after digitisation. It was shown that the response of the image sensor to the heavy ion bombardment varied with the type and energy of the projectiles. The sensor will be used for the CMS Barrel Muon Alignment system.
Keywords :
Nuclear track visualisation , Radiation tolerance , Detector response , Heavy ion irradiation , CMOS image sensor chip
Journal title :
Nuclear Instruments and Methods in Physics Research Section A
Serial Year :
2004
Journal title :
Nuclear Instruments and Methods in Physics Research Section A
Record number :
2202777
Link To Document :
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