Title of article :
A chip removal facility for indium bump bonded pixel detectors
Author/Authors :
Airoldi، نويسنده , , A. and Alimonti، نويسنده , , G. and Amati، نويسنده , , Amy M. and Andreazza، نويسنده , , A. and Bulgheroni، نويسنده , , A. and Caccia، نويسنده , , M. and Giugni، نويسنده , , D. and Kucewicz، نويسنده , , W. and Lari، نويسنده , , T. and Meroni، نويسنده , , C. and Ragusa، نويسنده , , F. and Troncon، نويسنده , , C. and Vegni، نويسنده , , G.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2005
Pages :
7
From page :
259
To page :
265
Abstract :
Yield maximization in multichip hybrid pixel sensors is a crucial issue in large volume productions planned for future High-Energy Physics experiments. Bump bonding process optimization can guarantee statistical single bump failure rates at the acceptable level of 10–100 ppm; nevertheless, systematic effects connected to process repeatability can affect the functionality of a full chip in a module to a much larger extent. Because of this, the reversibility of the bonding procedure has been investigated. A feasibility study on single chip assemblies for the ATLAS experiment has been successfully completed, proving the possibility of reworking. As a result of it, a dedicated facility has been conceptually designed, engineered and commissioned. The characteristics of the facility in terms of motion, temperature and tensile strength control are outlined, together with the main results.
Keywords :
Indium bump , Pixel detector , Stripping
Journal title :
Nuclear Instruments and Methods in Physics Research Section A
Serial Year :
2005
Journal title :
Nuclear Instruments and Methods in Physics Research Section A
Record number :
2203203
Link To Document :
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