Title of article :
Radiation hardness performance of ATLAS pixel tracker
Author/Authors :
Troncon، نويسنده , , Clara، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2004
Pages :
6
From page :
65
To page :
70
Abstract :
The first ATLAS pixel assemblies with both radiation tolerant sensors and 0.25 μm electronics have been produced and irradiated with 24 GeV/c protons up to a fluence of 1.1×1015 1 MeV neq cm−2 and a dose of 60 Mrad. They have been tested in a beam and were found to fulfill all the requirements to operate at the LHC in terms of in-time efficiency and resolution. The depletion depth and charge collection efficiency to m.i.p. of n+-in-n DOFZ silicon pixel sensors have been measured for different defect annealing scenarios as well as charge trapping time constants. Results are presented here.
Keywords :
charge trapping , DOFZ silicon , Charge collection , Radiation damage
Journal title :
Nuclear Instruments and Methods in Physics Research Section A
Serial Year :
2004
Journal title :
Nuclear Instruments and Methods in Physics Research Section A
Record number :
2203801
Link To Document :
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