Title of article
Beam test of a segmented foil SEM grid
Author/Authors
Kopp، نويسنده , , S.E. and Indurthy، نويسنده , , Laura D. and Pavlovich، نويسنده , , Z. and Proga، نويسنده , , M. and Zwaska، نويسنده , , R. and Childress، نويسنده , , S. and Ford، نويسنده , , R. and Kendziora، نويسنده , , C. and Kobilarcik، نويسنده , , T. and Moore، نويسنده , , C. and Tassotto، نويسنده , , G.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2005
Pages
9
From page
138
To page
146
Abstract
A prototype Secondary-electron Emission Monitor (SEM) was installed in the 8 GeV proton transport line for the MiniBooNE experiment at Fermilab. The SEM is a segmented grid made with 5 μ m Ti foils, intended for use in the 120 GeV NuMI beam at Fermilab. Similar to previous workers, we found that the full collection of the secondary electron signal requires a bias voltage to draw the ejected electrons cleanly off the foils, and this effect is more pronounced at larger beam intensity. The beam centroid and width resolutions of the SEM were measured at beam widths of 3, 7, and 8 mm, and compared to calculations. Extrapolating the data from this beam test, we expect a centroid and width resolutions of δ x beam = 20 μ m and δ σ beam = 25 μ m , respectively, in the NuMI beam which has 1 mm spot size.
Keywords
instrumentation , particle beam , Secondary electron emission
Journal title
Nuclear Instruments and Methods in Physics Research Section A
Serial Year
2005
Journal title
Nuclear Instruments and Methods in Physics Research Section A
Record number
2204328
Link To Document