Title of article :
Target characterization by PIXE, alpha spectrometry and X-ray absorption
Author/Authors :
Kheswa، نويسنده , , N.Y. and Papka، نويسنده , , P. and Pineda-Vargas، نويسنده , , C.A. and Newman، نويسنده , , R.T.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2011
Abstract :
We report on the thickness and homogeneity characterization of thin metallic targets of Zr-96 by means of alpha absorption spectrometry, Particle Induced X-ray Emission (PIXE) and X-ray absorption. The target thicknesses determined by means of the above mentioned methods are critically compared. The thicknesses were determined before and after irradiation with a 70 MeV beam of 14N ions.
Keywords :
Target characterization , PIXE , X-ray Absorption , Target thickness , Alpha spectrometry
Journal title :
Nuclear Instruments and Methods in Physics Research Section A
Journal title :
Nuclear Instruments and Methods in Physics Research Section A
