• Title of article

    Beam test results for the RAPS03 non-epitaxial CMOS active pixel sensor

  • Author/Authors

    Biagetti، نويسنده , , Daniele and Marras، نويسنده , , Alessandro and Meroli، نويسنده , , Stefano and Passeri، نويسنده , , Daniele and Placidi، نويسنده , , Pisana and Servoli، نويسنده , , Leonello and Tucceri، نويسنده , , Paola، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2011
  • Pages
    4
  • From page
    230
  • To page
    233
  • Abstract
    Recently our group has been investigating the possibility of using a standard CMOS technology – featuring no epitaxial layer – to fabricate a sensor for charged particle detection. In this work we present the results obtained exposing sensors with 256×256 pixels ( 10 × 10 μ m pixel size, two different pixel layouts) to 180 GeV protons and positrons at the SuperProtoSynchrotron facility (CERN). We have investigated the different response of the two architectural options in terms of S/N, cluster width, intrinsic spatial resolution, efficiency. The results show a good Landau response, S/N about 22 with an average cluster size of 4.5 pixels, and an intrinsic spatial resolution of 1.5 μ m (order of 1/7th of the pixel size).
  • Keywords
    CMOS , Non-epitaxial , pixel
  • Journal title
    Nuclear Instruments and Methods in Physics Research Section A
  • Serial Year
    2011
  • Journal title
    Nuclear Instruments and Methods in Physics Research Section A
  • Record number

    2207662