Title of article :
Beam test results for the RAPS03 non-epitaxial CMOS active pixel sensor
Author/Authors :
Biagetti، نويسنده , , Daniele and Marras، نويسنده , , Alessandro and Meroli، نويسنده , , Stefano and Passeri، نويسنده , , Daniele and Placidi، نويسنده , , Pisana and Servoli، نويسنده , , Leonello and Tucceri، نويسنده , , Paola، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2011
Abstract :
Recently our group has been investigating the possibility of using a standard CMOS technology – featuring no epitaxial layer – to fabricate a sensor for charged particle detection. In this work we present the results obtained exposing sensors with 256×256 pixels ( 10 × 10 μ m pixel size, two different pixel layouts) to 180 GeV protons and positrons at the SuperProtoSynchrotron facility (CERN). We have investigated the different response of the two architectural options in terms of S/N, cluster width, intrinsic spatial resolution, efficiency. The results show a good Landau response, S/N about 22 with an average cluster size of 4.5 pixels, and an intrinsic spatial resolution of 1.5 μ m (order of 1/7th of the pixel size).
Keywords :
CMOS , Non-epitaxial , pixel
Journal title :
Nuclear Instruments and Methods in Physics Research Section A
Journal title :
Nuclear Instruments and Methods in Physics Research Section A