Author/Authors :
Birkenbach، نويسنده , , B. and Bruyneel، نويسنده , , B. and Pascovici، نويسنده , , G. and Eberth، نويسنده , , J. and Hess، نويسنده , , H. and Lersch، نويسنده , , D. and Reiter، نويسنده , , P. and Wiens، نويسنده , , A.، نويسنده ,
Abstract :
The space charge distribution of a large volume highly segmented HPGe detector was determined by a non-destructive capacitance–voltage measurement. The capacitances between the 36 segments and the core were measured simultaneously with a precision pulser which was implemented in the core preamplifier. The pulser measurement was compared to and validated by direct capacitance measurements. The three-dimensional doping profile was reconstructed using analytical and numerical methods. Consistent values for the impurity concentration in the range of 0.5 and 1.5×1010 cm−3 were obtained.
Keywords :
Segmented HPGe-detectors , Capacitance–voltage , Current–voltage characteristic , Impurity concentration