Title of article
Ageing of CsI thin film photocathodes induced by UV photons
Author/Authors
Singh، نويسنده , , B.K. and Nitti، نويسنده , , M.A. and Valentini، نويسنده , , A. and Nappi، نويسنده , , E. and Coluzza، نويسنده , , C. and Di Santo، نويسنده , , G. and Zanoni، نويسنده , , R.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2007
Pages
5
From page
651
To page
655
Abstract
The degradation of CsI thin film photocathodes (PCs) under UltraViolet (UV) irradiation has been investigated by measuring the photocurrent as well as the absolute Quantum Efficiency (QE) as a function of the accumulated charge density.
Force Microscopy (AFM) and UV Photoemission Electron Microscopy (PEEM) have been employed to study the surface morphology and the local QE of polycrystalline CsI thin films and their transformation due to UV irradiation.
otoemissive properties of CsI PCs, together with their surface morphology, have been found to be strongly affected by the UV photon ageing.
Keywords
Quantum efficiency , atomic force microscopy , Photodetectors , CsI photocathodes
Journal title
Nuclear Instruments and Methods in Physics Research Section A
Serial Year
2007
Journal title
Nuclear Instruments and Methods in Physics Research Section A
Record number
2208442
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