Author/Authors :
Domingo-Pardo، نويسنده , , Joy C. and Goel، نويسنده , , N. and Engert، نويسنده , , T. and Gerl، نويسنده , , J. and Kojouharov، نويسنده , , I. and Schaffner، نويسنده , , H. and Didierjean، نويسنده , , F. and Duchêne، نويسنده , , G. and Sigward، نويسنده , , M.H.، نويسنده ,
Abstract :
A new technique for the pulse-shape characterization of γ ‐ ray position sensitive germanium detectors is presented. This method combines the pulse shape comparison scan (PSCS) principle with a γ ‐ ray imaging technique. The latter is provided by a supplementary, high performance, position sensitive γ ‐ ray scintillator detector. We describe the basic aspects of the method and we show measurements made for the study of pulse-shapes in a non-segmented planar HPGe detector. A preliminary application of the PSCS is carried out, although a more detailed investigation is being performed with highly segmented position sensitive detectors.
Keywords :
Pulse shape analysis , Semiconductor , Tracking , ? ? detector
