Title of article
Sapphire analyzers for high-resolution X-ray spectroscopy
Author/Authors
Yava?، نويسنده , , Hasan and Ercan Alp، نويسنده , , E. and Sinn، نويسنده , , Harald and Alatas، نويسنده , , Ahmet and Said، نويسنده , , Ayman H. and Shvyd’ko، نويسنده , , Yuri and Toellner، نويسنده , , Thomas and Khachatryan، نويسنده , , Ruben and Billinge، نويسنده , , Simon J.L. and Zahid Hasan، نويسنده , , M. and Sturhahn، نويسنده , , Wolfgang، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2007
Pages
3
From page
149
To page
151
Abstract
We present a sapphire ( Al 2 O 3 ) analyzer for high-resolution X-ray spectroscopy with 31-meV energy resolution. The analyzer is designed for resonant inelastic X-ray scattering (RIXS) measurements at the CuK α absorption edge near 8990 eV. The performance of the analyzer is demonstrated by measuring phonon excitations in beryllium because of its known dynamical structure and high counting rates.
Keywords
Resonant inelastic X-ray scattering , Synchrotron instrumentation , Sapphire , X-ray spectrometer
Journal title
Nuclear Instruments and Methods in Physics Research Section A
Serial Year
2007
Journal title
Nuclear Instruments and Methods in Physics Research Section A
Record number
2208677
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