Author/Authors :
Shu، نويسنده , , D. and Maser، نويسنده , , J. and Holt، نويسنده , , M. and Winarski، نويسنده , , R. and Preissner، نويسنده , , C. and Lai، نويسنده , , Ana B. and Vogt، نويسنده , , S. and Stephenson، نويسنده , , G.B.، نويسنده ,
Abstract :
This paper presents the design of a robot-based detector manipulator for microdiffraction applications with a hard X-ray nanoprobe instrument system being constructed at the Advanced Photon Source (APS) for the Center for Nanoscale Materials (CNM) being constructed at Argonne National Laboratory (ANL). Applications for detectors weighing from 1.5 to 100 kg were discussed in three configurations.
Keywords :
industrial robot , Robot arm , Scanning stage , Microdiffraction
