Characterization and application of a GE amorphous silicon flat panel detector in a synchrotron light source

Characterization, in the language of synchrotron radiation, was performed on a GE Revolution 41RT flat panel detector using the X-ray light source at the Advanced Photon Source (APS). The detector has an active area of 41×41 cm2 with 200×200 μm2 pixel size. The nominal working photon energy is around 80 keV. Modulation transfer function (MTF) was measured in terms of line spread function (LSF) using a 25 μm×1 cm tungsten slit. Memory effects of the detector elements, called lag, were also measured. The large area and fast data capturing rate −8 fps in unbinned mode, 30 fps in binned or region of interest (ROI) mode—make the GE flat panel detector a unique and very versatile detector for synchrotron experiments. In particular, we present data from pair distribution function (PDF) measurements to demonstrate the special features of this detector.