Title of article
Combined XRD and XAS
Author/Authors
Ehrlich، نويسنده , , S.N. and Hanson، نويسنده , , J.C. and Lopez Camara، نويسنده , , A. and Barrio، نويسنده , , L. and Estrella، نويسنده , , M. and Zhou، نويسنده , , G. and Si، نويسنده , , R. and Khalid، نويسنده , , S. and Wang، نويسنده , , Q.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2011
Pages
3
From page
213
To page
215
Abstract
X-ray diffraction (XRD) and X-ray absorption fine structure (XAFS) are complementary techniques for investigating the structure of materials. XRD probes long range order and XAFS probes short range order. We have combined the two techniques at one synchrotron beamline, X18A at the NSLS, allowing samples to be studied in a single experiment. This beamline will allow for coordinated measurements of local and long range structural changes in chemical transformations and phase transitions using both techniques.
Keywords
Time-resolved XRD , XRD , XAFS , Combined XRD/XAFS , Quick XAFS
Journal title
Nuclear Instruments and Methods in Physics Research Section A
Serial Year
2011
Journal title
Nuclear Instruments and Methods in Physics Research Section A
Record number
2208810
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