Application of simple negative feedback model for avalanche photodetectors investigation

A simple negative feedback model based on Millerʹs formula is used to investigate the properties of Avalanche Photodetectors (APDs). The proposed method can be applied to study classical APD as well as new type of devices, which are operating in the Internal Negative Feedback (INF) regime. The method shows a good sensitivity to technological APD parameters making it possible to use it as a tool to analyse various APD parameters. It also allows better understanding of the APD operation conditions. The simulations and experimental data analysis for different types of APDs are presented.