Title of article
Measuring magnetic excitations in microstructures using X-ray microscopy
Author/Authors
Quitmann، نويسنده , , C. and Raabe، نويسنده , , J. and Buehler، نويسنده , , C. and Buess، نويسنده , , M. and Johnson، نويسنده , , S. and Nolting، نويسنده , , F. and Schlott، نويسنده , , V. and Streun، نويسنده , , A.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2008
Pages
8
From page
494
To page
501
Abstract
We describe the imaging of magnetic excitation in microstructures with a photoemission electron microscope (PEEM) installed at an undulator beamline of the Swiss Light Source. The experiment uses a stroboscopic pump–probe–gate setup. A laser synchronized to the storage ring switches currents in a coplanar wave guide resulting in magnetic field pulses of 100 ps rise time and up to 80 Oe amplitude. We measure the spatial distribution of the magnetization M(r, Δt) using X-ray magnetic circular dichroism. The results allow quantitative analysis of the magnetization with better than 100 nm spatial resolution and provide information on the frequencies, shapes and the damping of magnetic eigenmodes.
Keywords
PEEM , Dynamic Properties , Magnetic properties of thin films/nanostructures , Time resolved
Journal title
Nuclear Instruments and Methods in Physics Research Section A
Serial Year
2008
Journal title
Nuclear Instruments and Methods in Physics Research Section A
Record number
2209447
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