Systematic effects in pulse shape analysis of HPGe detector signals for

Pulse shape analysis is an important background reduction and signal identification technique for next generation of 76Ge 0 ν β β experiments. We present a study of the systematic uncertainties in one such parametric pulse-shape analysis technique for separating multi-site background from single-site signal events. We examined systematic uncertainties for events in full-energy gamma peaks (predominantly multi-site), double-escape peaks (predominantly single-site) and the Compton continuum near Q β β (which will be the dominant background for most 0 ν β β searches). In short, we find total (statistical plus systematic) fractional uncertainties in the pulse shape cut survival probabilities of: 6.6%, 1.5% and 3.8% for double-escape, continuum and γ ‐ ray events, respectively.