Title of article :
Characterization of spatial homogeneity of sensitivity and radiation resistance of semiconductor detectors in the soft X-ray range
Author/Authors :
Aruev، نويسنده , , P.N. and Kolokolnikov، نويسنده , , Yu.M. and Kovalenko، نويسنده , , N.V. and Legkodymov، نويسنده , , A.A. and Lyakh، نويسنده , , V.V and Nikolenko، نويسنده , , A.D and Pindyurin، نويسنده , , V.F. and Sukhanov، نويسنده , , V.L. and Zabrodsky، نويسنده , , V.V.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2009
Pages :
4
From page :
58
To page :
61
Abstract :
We at Siberian Synchrotron Radiation Center (Novosibirsk) have conducted comparative studies of spatial homogeneity of sensitivity and radiation resistance of semiconductor detectors SPD-100UV developed by the Physical Technical Institute (St. Petersburg) as well as AXUV-100 (made by IRD Inc., USA). These works were carried out at the “Cosmos” station on the VEPP-4 storage ring in the soft X-ray range (80–1000 eV).
Keywords :
Synchrotron radiation , X-ray range , VUV , Radiation resistance
Journal title :
Nuclear Instruments and Methods in Physics Research Section A
Serial Year :
2009
Journal title :
Nuclear Instruments and Methods in Physics Research Section A
Record number :
2211076
Link To Document :
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