Title of article
Direct electron detection for TEM with column parallel CCD
Author/Authors
Moldovan، نويسنده , , Grigore and Jeffery، نويسنده , , Ben and Nomerotski، نويسنده , , Andrei and Kirkland، نويسنده , , Angus، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2009
Pages
3
From page
108
To page
110
Abstract
Step improvements in electron detectors are needed for transmission electron microscopes (TEM) to take full advantage of latest developments in electron optics and electron sources. This work presents beam tests performed with column parallel charge-coupled devices (CPCCD) and discusses measured cluster properties. Excellent signal-to-noise ratio is found, demonstrating that CPCCD are well suited for TEM. Large variations in cluster-integrated intensity and size are observed, attributed to the strong scattering of 120–200 keV electrons in silicon. Spatial momentum analysis of clusters reveals strong asymmetry indicating that position resolution could be limited for certain cluster shapes.
Keywords
Transmission electron microscope , Position-sensitive particle detector , Direct electron detector , Column parallel charge-coupled device
Journal title
Nuclear Instruments and Methods in Physics Research Section A
Serial Year
2009
Journal title
Nuclear Instruments and Methods in Physics Research Section A
Record number
2211190
Link To Document