Title of article :
TCT and test beam results of irradiated magnetic Czochralski silicon (MCz-Si) detectors
Author/Authors :
Luukka، نويسنده , , P. and Hنrkِnen، نويسنده , , J. and Mنenpنن، نويسنده , , T. and Betchart، نويسنده , , B. and Czellar، نويسنده , , S. and Demina، نويسنده , , R. and Furgeri، نويسنده , , A. and Gotra، نويسنده , , Y. and Frey، نويسنده , , M. and Hartmann، نويسنده , , F. and Korjenevski، نويسنده , , S. and Kortelainen، نويسنده , , M.J. and Lampén، نويسنده , , T. and Ledermann، نويسنده , , B. Guardiola-Lemaitre، نويسنده , , V. and Liamsuwan، نويسنده , , T. and Militaru، نويسنده , , O. and Moilanen، نويسنده , , H. and Simonis، نويسنده , , H.J. and Spiegel، نويسنده , , L. and Tuominen، نويسنده , , E. and Tuominiemi، نويسنده , , Samuel J. and Tuovinen، نويسنده , , E.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2009
Pages :
4
From page :
254
To page :
257
Abstract :
Pad and strip detectors processed on high resistivity n-type magnetic Czochralski silicon (MCz-Si) were irradiated to several different fluences with protons. The pad detectors were characterized with the transient current technique (TCT) and the full-size strip detectors with a reference beam telescope and a 225 GeV muon beam. The TCT measurements indicate a double junction structure and space charge sign inversion in MCz-Si detectors after 6 × 10 14 1 MeV n eq / cm 2 fluence. In the beam test a signal-to-noise (S/N) ratio of 50 was measured for a non-irradiated MCz-Si sensor, and a S/N ratio of 20 for the sensors irradiated to the fluences of 1 × 10 14 1 and 5 × 10 14 1 MeV n eq / cm 2 .
Keywords :
Beam test , Transient current technique , Double junction , Magnetic Czochralski silicon
Journal title :
Nuclear Instruments and Methods in Physics Research Section A
Serial Year :
2009
Journal title :
Nuclear Instruments and Methods in Physics Research Section A
Record number :
2211229
Link To Document :
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